Diagnostic Measurements In Lsi/vlsi Integrated Circuits Production

By: Andrzej Jakubowski, Wieslaw Marciniak, Henryk M. Przewlocki

Write A Review

Hardcover | 1 April 1991

At a Glance

Hardcover
372 Pages

Dimensions(cm)
22.86 x 15.88 x 2.54

Hardcover

RRP $216.99

$195.75

10%OFF

or 4 interest-free payments of $48.94 with

Ships in 15 to 25 business days

This book describes means in improving the technology of LSI/VLSI ICs production. It does so by concentrating on improvements of manufacturing yield and quality of the products by detecting weak points which should be eliminated on the way up the learning curve. The book presents a systematic approach to the problem, covering primarily methods based on the use of test patterns measurements, in both mass production and in research and development activities. The main groups of defects found in IC chips and ways to detect them using test structures are discussed in detail.

Shipping

	Standard Shipping	Express Shipping
Metro postcodes:	$9.99	$14.95
Regional postcodes:	$9.99	$14.95
Rural postcodes:	$9.99	$14.95

Orders over $79.00 qualify for free shipping.

How to return your order

At Booktopia, we offer hassle-free returns in accordance with our returns policy. If you wish to return an item, please get in touch with Booktopia Customer Care.

Additional postage charges may be applicable.