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Defects in SiO2 and Related Dielectrics : Defects in SiO2 and Related Dielectrics: Science and Technology Proceedings of the NATO Advanced Study Institute, Erice, Italy, April 8-20, 2000 - Gianfranco Pacchioni

Defects in SiO2 and Related Dielectrics

Defects in SiO2 and Related Dielectrics: Science and Technology Proceedings of the NATO Advanced Study Institute, Erice, Italy, April 8-20, 2000

By: Gianfranco Pacchioni (Editor), Linards Skuja (Editor), David L. Griscom (Editor)

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Published: 31st December 2000
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Silicon dioxide plays a central role in most contemporary electronic and photonic technologies, from fiber optics for communications and medical applications to metal-oxide-semiconductor devices. Many of these applications directly involve point defects, which can either be introduced during the manufacturing process or by exposure to ionizing radiation. They can also be deliberately created to exploit new technologies.
This book provides a general description of the influence that point defects have on the global properties of the bulk material and their spectroscopic characterization through ESR and optical spectroscopy.

Preface
Structure and Topology
Defect-free vitreous networks: The idealised structure of SiO2 and related glasses
Topology and topological disorder in silica
Bulk Defects
Optical properties of defects in silica
The natures of point defects in amorphous silicon dioxide
Ab initio theory of point defects in SiO2
A demi-century of magnetic defects in alpha-quartz
Interaction of SiO2 glasses with high energy ion beams and vacuum UV excimer laser pulses
Excitons, localized states in silicon dioxide and related crystals and glasses
Gamma rays induced conversion of native defects in natural silica
Ge and Sn doping in silica: structural changes, optically active defects, paramagnetic sites
Computational studies of self-trapped excitons in silica
Surface Defects. Defects on activated silica surface
Ab-initio molecular dynamics simulation of amorphous silica surface
Bragg Grating
periodic UV-induced index modulations in doped-silica optical fibers: formation and properties of the fiber Bragg grating
Bulk silicas prepared by low presssure plasma CVD: formation of structure and point defects
Change of spectroscopic and structural properties of germanosilicate glass uner mechanical compression and UV irradiation
UV photoinduced phenomena in oxygen-deficient silica glasses
One- and two-quantum UV photo-reactions in pure and doped silica glasses
2. Germanium oxygen deficient centers (GODC). V.N. Bagratashvili, et al
Photoinduced refractive index change and second harmonic generation in MCVD germanosilicate core fibers fabricated in reduced (nitrogen and helium) atmospheres
Si/SiO2 Interface and Gate Dielectrics
Molecular hydrogen interaction kinetics of interfacial Si dangling bonds in thermal (111)Si/SiO2
An electron spin resonance saga
Ultrathin oxide films for advanced gate dielectrics applications Current progress and future challenges
SiC/SiO2 interface defects
Point defects in Si-SiO2 systems: current understanding
Index
Table of Contents provided by Publisher. All Rights Reserved.

ISBN: 9780792366850
ISBN-10: 0792366859
Series: NATO Science Series II
Audience: Professional
Format: Hardcover
Language: English
Number Of Pages: 624
Published: 31st December 2000
Publisher: Springer
Country of Publication: NL
Dimensions (cm): 23.5 x 15.5  x 4.45
Weight (kg): 2.34