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Characterization of Semiconductor Materials, Volume 1 : Principles and Methods :  Principles and Methods - Gary F. McGuire

Characterization of Semiconductor Materials, Volume 1 : Principles and Methods

Principles and Methods

Hardcover

Published: August 1989
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Characterization of semiconductor materials and methods used to characterize them will be described extensively in this new Noyes series. Written by experts in each subject area, the series will present the most up-to-date information available in this rapidly advancing field.

Electrical Characterization of Semiconductor Materials and Devices
Secondary Ion Mass Spectrometry
Photoelectron Spectroscopy: Applications to Semiconductors
Ion/Solid Interaction in Surface Analysis
Molecular Characterization of Dielectric Films by Laser Raman Spectroscopy
Characterization of Semiconductors Surfaces by Appearance Potential Spectroscopy
References
Index
Table of Contents provided by Publisher. All Rights Reserved.

ISBN: 9780815512004
ISBN-10: 0815512007
Series: Characterization of Semiconductor Materials : Book 1
Audience: Professional
Format: Hardcover
Language: English
Number Of Pages: 342
Published: August 1989
Country of Publication: US
Dimensions (cm): 24.13 x 16.26  x 2.87
Weight (kg): 0.74