+612 9045 4394
 
CHECKOUT
Characterization of High Tc Materials and Devices by Electron Microscopy - Nigel D. Browning

Characterization of High Tc Materials and Devices by Electron Microscopy

By: Nigel D. Browning (Editor), Stephen J. Pennycook (Editor)

Hardcover

Published: 24th July 2000
Ships: 7 to 10 business days
7 to 10 business days
$300.50
or 4 easy payments of $75.13 with Learn more

Other Available Formats (Hide)

  • Paperback View Product Published: 23rd November 2006
    $53.75

This is a clear and up-to-date account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, this compilation provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications. Introductory chapters cover the basics of high-resolution transmission electron microscopy, including a chapter devoted to specimen preparation techniques and microanalysis by scanning transmission electron microscopy. Ensuing chapters examine identification of new superconducting compounds, imaging of superconducting properties by low-temperature scanning electron microscopy, imaging of vortices by electron holography and electronic structure determination by electron energy loss spectroscopy. The use of scanning tunneling microscopy for exploring surface morphology, growth processes and the mapping of superconducting carrier distributions is also discussed. Final chapters consider applications of electron microscopy to the analysis of grain boundaries, thin films and device structures. Detailed references are included. This book will interest graduate students and researchers in condensed matter physics and material science.

'... a useful and nearly comprehensive guide to current work in the subject.' J. P. Davey, Contemporary Physics

List of contributors
Preface
High-resolution transmission electron microscopy
Holography in the transmission electron microscope
Microanalysis by scanning transmission electron microscopy
Specimen preparation for transmission electron microscopy
Low-temperature scanning electron microscopy
Scanning tunneling microscopy
Identification of new superconducting compounds by electron microscopy
Valence band electron energy loss spectroscopy (EELS) of oxide superconductors
Investigation of charge distribution in Bi2Sr2CaCu2O8 and YBa2Cu3O7
Grain boundaries in high Tc materials: transport properties and structure
The atomic structure and carrier concentration at grain boundaries in YBa2Cu3O7-d
Microstructures in superconducting YBa2Cu3O7 thin films
Investigations on the microstructure of YBa2Cu3O7 thin-film edge Josephson junctions by high-resolution electron microscopy
Controlling the structure and properties of high Tc thin-film devices
Table of Contents provided by Publisher. All Rights Reserved.

ISBN: 9780521554909
ISBN-10: 052155490X
Audience: Professional
Format: Hardcover
Language: English
Number Of Pages: 406
Published: 24th July 2000
Publisher: Cambridge University Press
Country of Publication: GB
Dimensions (cm): 24.7 x 17.4  x 2.4
Weight (kg): 0.85