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Characterization of Amorphous and Crystalline Rough Surface -- Principles and Applications : Volume 37 - Yiping Zhao

Characterization of Amorphous and Crystalline Rough Surface -- Principles and Applications

Volume 37

By: Yiping Zhao (Editor), Gwo-Ching Wang (Editor), Toh-Ming Lu (Editor), Marc De Graef (Editor), Thomas B. Lucatorto (Editor)

Hardcover Published: 1st October 2000
ISBN: 9780124759848
Number Of Pages: 417

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The structure of a growth or an etch front on a surface is not only a subject of great interest from the practical point of view but also is of fundamental scientific interest. Very often surfaces are created under non-equilibrium conditions such that the morphology is not always smooth.
In addition to a detailed description of the characteristics of random rough surfaces, Experimental Methods in the Physical Sciences, Volume 37, Characterization of Amorphous and Crystalline Rough Surface-Principles and Applications will focus on the basic principles of real and diffraction techniques for quantitative characterization of the rough surfaces. The book thus includes the latest development on the characterization and measurements of a wide variety of rough surfaces. The complementary nature of the real space and diffraction techniques is fully displayed.
Key Features
* An accessible description of quantitative characterization of random rough surfaces and growth/etch fronts
* A detailed description of the principles, experimentation, and limitations of advanced real-space imaging techniques (such as atomic force microscopy) and diffraction techniques (such as light scattering, X-ray diffraction, and electron diffraction)
* Characterization of a variety of rough surfaces (e.g., self-affine, mounded, anisotropic, and two-level surfaces) accompanied by quantitative examples to illustrate the essence of the principles
* An insightful description of how rough surfaces are formed
* Presentation of the most recent examples of the applications of rough surfaces in various areas

Volumes in Seriesp. xi
Prefacep. xv
Referencesp. 5
Statistical Nature of Rough Surfaces
First-Order Statistics: Surface Height Distribution Function and Characteristic Functionp. 7
Second-Order Statistics: Auto-Correlation Function, Height-Height Correlation Function, and Power Spectrump. 13
Other Statistical Properties of a Random Rough Surfacep. 21
Numerical Estimation of the Roughness Parametersp. 23
Summaryp. 32
Referencesp. 32
Examples of Random Rough Surfaces
Self-Affine Surfacesp. 33
Mounded Surfacesp. 42
Anisotropic Surfacesp. 47
Dynamics of Random Rough Surface Formationp. 54
Generating Rough Surfacesp. 56
Summaryp. 58
Referencesp. 59
Real-Space Surface Profiling Techniques
Scanning Techniquesp. 63
Imaging Techniquesp. 77
Summaryp. 81
Referencesp. 81
Effects of Finite Tip and Sample Sizes
Finite Tip Size Effects in SPM Measurementsp. 83
Finite Sampling Size Effect in Image Analysisp. 88
Summaryp. 101
Referencesp. 102
Diffraction Techniques--Fundamentals
Scattering and Diffraction Conceptsp. 104
Multi-Atom Diffractionp. 110
Diffraction from Rough Surfaces--General Formulap. 117
Diffraction from Rough Surfaces--Continuum Theoryp. 122
Summaryp. 132
Referencesp. 132
Diffraction from Random Rough Surfaces
General Properties of Diffraction Profilesp. 133
Diffraction from a Gaussian Rough Surfacep. 135
Diffraction from Multi-Step Surfaces in 2+1 Dimensionsp. 142
Summaryp. 155
Referencesp. 156
Diffraction Techniques--Experimentation
The Diffraction Geometriesp. 157
The Measured Diffraction Intensity Profilep. 165
Practical Issues in Diffraction Measurementp. 172
Summaryp. 175
Referencesp. 176
Self-Affine Fractal Surfaces
Real-Space Characteristicsp. 179
Diffraction from an Isotropic Self-Affine Gaussian Surfacep. 181
An Example: The Backside of Silicon Wafersp. 189
Diffraction from Discrete Self-Affine Surfacesp. 203
Summaryp. 208
Referencesp. 209
Mounded Surfaces
Real-Space Characteristicsp. 211
Diffraction from Mounded Surfacesp. 212
Diffraction from Discrete Mounded Surfacesp. 216
Examplesp. 217
Summaryp. 219
Referencesp. 221
Anisotropic Surfaces
Real-Space Characteristicsp. 223
Diffraction from Anisotropic Surfacesp. 224
An Example: The Hard-Disk Surfacep. 231
Summaryp. 239
Referencesp. 239
Non-Gaussian Surfaces
Height Difference Distribution P(z, r) and Height Difference Function C(k[perpendicular, bottom], r)p. 241
Diffraction Structure Factors from Non-Gaussian Surfacesp. 247
Summaryp. 254
Referencesp. 254
Two-Dimensional Fractal Surfaces
A Discrete Two-Level Surfacep. 255
Special Cases for Discrete Two-Level Surfacesp. 257
Continuous Two-Level Surfacesp. 266
Determination of Roughness Parametersp. 270
Summaryp. 271
Referencesp. 271
Transition to Multilayer Structures
Intensity Oscillationsp. 274
Diffraction from Dynamic Roughening Frontsp. 291
Summaryp. 300
Referencesp. 300
Transmission Diffraction and Fractals
Transmission Diffraction Geometryp. 303
Three-Dimensional Fractal Structuresp. 305
Diffraction Characteristicsp. 306
Referencesp. 308
Effects of Surface Roughness: Examples
Local Slope, Surface Area, and Surface Energyp. 309
Effect of Surface/Interface Roughness on Electrical Properties of Thin Filmsp. 311
Effect of Surface/Interface Roughness on Magnetic Properties of Thin Filmsp. 319
Effect of Surface/Interface Roughness on Electronic Device Operationsp. 332
Summaryp. 348
Referencesp. 348
Growth Dynamicsp. 353
Time Evolution of the Interface Width in the Edwards-Wilkinson Equationp. 381
Effect of Different Functional Forms of the Scaling Function on the Shape of the Diffraction Profilep. 383
Joint Distributions of Random Processes with Non-Gaussian Height Distributionsp. 387
Height Difference Function C(k[perpendicular, bottom], r) for Different Height Distributionsp. 391
A Perturbative Solution of Sine-Gorden Equationp. 399
Specklep. 403
Diffraction of an Ultrafast Radiation Pulsep. 407
Indexp. 411
Table of Contents provided by Syndetics. All Rights Reserved.

ISBN: 9780124759848
ISBN-10: 012475984X
Series: Experimental Methods in the Physical Sciences : Book 37
Audience: Professional
Format: Hardcover
Language: English
Number Of Pages: 417
Published: 1st October 2000
Country of Publication: US
Dimensions (cm): 23.6 x 15.98  x 2.52
Weight (kg): 0.73

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