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Characterisation of Radiation Damage by Transmission Electron Microscopy : Microscopy in Materials Science Series - M. L. Jenkins

Characterisation of Radiation Damage by Transmission Electron Microscopy

Microscopy in Materials Science Series

Hardcover Published: 21st November 2000
ISBN: 9780750307482
Number Of Pages: 224

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Characterization of Radiation Damage by Transmission Electron Microscopy details the electron microscopy methods used to investigate complex and fine-scale microstructures, such as those produced by fast-particle irradiation of metals or ion implantation of semiconductors. The book focuses on the methods used to characterize small point-defect clusters, such as dislocation loops, because the coverage in general microscopy textbooks is limited and omits many of the problems associated with the analysis of these defects. The book also describes in situ, high-resolution, and analytical techniques. Techniques are illustrated with examples, providing a solid overview of the contribution of TEM to radiation damage mechanisms. The book is most useful to researchers in, or entering into, the field of defect analysis in materials.

Preface
The role of transmission electron microscopy in characterizing radiation damagep. 1
An introduction to the available contrast mechanisms and experimental techniquesp. 6
Analysis of small centres of strain: the determination of loop morphologiesp. 27
Analysis of small centres of strain: determination of the vacancy or interstitial nature of small clustersp. 74
Analysis of small centers of strain: counting and sizing small clustersp. 110
Characterization of voids and bubblesp. 129
Techniques for imaging displacement cascadesp. 145
High-resolution imaging of radiation damagep. 159
In situ irradiation experimentsp. 173
Applications of analytical techniquesp. 194
Radiation damage in amorphous glassesp. 208
The Thompson tetrahedronp. 214
Referencesp. 216
Indexp. 222
Table of Contents provided by Blackwell. All Rights Reserved.

ISBN: 9780750307482
ISBN-10: 075030748X
Series: Microscopy in Materials Science Series
Audience: Professional
Format: Hardcover
Language: English
Number Of Pages: 224
Published: 21st November 2000
Country of Publication: GB
Dimensions (cm): 24.77 x 15.88  x 1.91
Weight (kg): 0.55
Edition Number: 1

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