The first comprehensive guide to ESD protection and I/O design<br> <br> Basic ESD and I/O Design is the first book devoted to ESD (electrostatic discharge) protection and input/output design. Addressing the growing demand in industry for high-speed I/O designs, it bridges the gap between ESD research and current VLSI design practices and provides a much-needed reference for practicing engineers who are frequently called upon to learn the subject on the job.<br> <br> This volume presents an integrated treatment of ESD, I/O, and process parameter interactions that both I/O designers and process designers can use. It examines key factors in I/O and ESD design and testing, and helps the reader consider ESD and reliability issues up front when making I/O choices. Emphasizing clarity and simplicity, this book focuses on design principles that can be applied widely as this dynamic field continues to evolve. Basic ESD and I/O Design: <br> * Describes strategies for design-oriented ESD protection <br> * Explains layout methods that enhance ESD protection designs <br> * Addresses basic I/O designs, including new problems such as mixed voltage interfaces <br> * Discusses fabrication aspects affecting ESD and I/O protection <br> * Illustrates concepts using numerous figures and examples <br> * Expresses device physics in terms of simple electrical circuit models <br> * Cross-references the material to standard texts in the field<br> <br> <br> Essential for engineers in industry and anyone designing circuits, systems, or devices for future technologies, Basic ESD and I/O Design is also a useful reference for researchers and graduate students involved in core VLSI design or computer architecture.
ESD Protection Methodology.
Additional ESD Considerations.
ESD and I/O Interactions.
ESD Reliability Measurement and Failure Analysis Basics.