+612 9045 4394
 
CHECKOUT
Atomic Force Microscopy/Scanning Tunneling Microscopy 2 - Samuel H. Cohen

Atomic Force Microscopy/Scanning Tunneling Microscopy 2

By: Samuel H. Cohen (Editor), Marcia L. Lightbody (Editor)

Hardcover Published: 30th April 1997
ISBN: 9780306455964
Number Of Pages: 250

Share This Book:

Hardcover

RRP $560.99
$388.50
31%
OFF
or 4 easy payments of $97.13 with Learn more
Ships in 10 to 15 business days

Other Available Editions (Hide)

This book represents the compilation of papers presented at the second Atomic Force Microscopy/Scanning Tunneling Microscopy (AFM/STM) Symposium, held June 7 to 9, 1994, in Natick, Massachusetts, at Natick Research, Development and Engineering Center, now part ofU.S. Army Soldier Systems Command. As with the 1993 symposium, the 1994 symposium provided a forum where scientists with a common interest in AFM, STM, and other probe microscopies could interact with one another, exchange ideas and explore the possibilities for future collaborations and working relationships. In addition to the scheduled talks and poster sessions, there was an equipment exhibit featuring the newest state-of-the-art AFM/STM microscopes, other probe microscopes, imaging hardware and software, as well as the latest microscope-related and sample preparation accessories. These were all very favorably received by the meeting's attendees. Following opening remarks by Natick's Commander, Colonel Morris E. Price, Jr., and the Technical Director, Dr. Robert W. Lewis, the symposium began with the Keynote Address given by Dr. Michael F. Crommie from Boston University. The agenda was divided into four major sessions. The papers (and posters) presented at the symposium represented a broad spectrum of topics in atomic force microscopy, scanning tunneling microscopy, and other probe microscopies.

Keynote Address: Scanned Probe Microscopyp. 1
Scanning Tunneling Microscopy for Very Large-Scale Integration (VLSI) Inspectionp. 7
Scanning Tunneling Microscopy-Based Fabrication of Nanometer Scale Structuresp. 23
A Microscopy for Our Timep. 41
Scanning Tunneling Microscopy of Chemical Vapor Deposition Diamond Film Growth on Highly Oriented Pyrolytic Graphite and Siliconp. 45
Scanning Tunneling Microscopy and Atomic Force Microscopy of Chemical-Vapor-Deposition Diamond and Diamond-Like Carbon Thin Filmsp. 53
Atomic Resolution Ultrahigh Vacuum Scanning Tunneling Microscopy of Diamond (100) Epitaxial Filmsp. 59
Scanning Force Microscopy Characterization of Biopolymer Films: Gelatin on Micap. 65
Gasification Studies of Graphite Surface by Scanning Tunneling Microscopyp. 75
Scanning Tunneling Microscopy Studies of Hydrocarbons Adsorbed on Graphite Surfacesp. 83
Visualization of the Surface Degradation of Biomedical Polymers in Situ with an Atomic Force Microscopep. 93
Scanning Tunneling Microscopy Investigations on Heteroepitaxially Grown Overlayers of Cu-phthalocyanine On Au(111) Surfacesp. 99
Characterization of Poly(tetrafluoroethylene) Surfaces by Atomic Force Microscopy - Results and Artifactsp. 107
Scanning Probe Microscopy Studies of Isocyanide Functionalized Polyaniline Thin Filmsp. 115
Investigations on the Topographic and Spectroscopic Imaging by the Scanning Tunneling Microscopep. 127
Observing Reactions via Flow Injection Scanning Tunneling Microscopyp. 137
Advances in Piezoresistive Cantilevers for Atomic Force Microscopyp. 147
Nanometer-Scale Qualitative Analysis of Surfaces with a Modified Scanning Tunneling Microscope/Field Emission Sourcep. 155
Atomic Force Microscopy Imaging of Single Ion Impacts on Micap. 161
Applications of Atomic Force Microscopy in Optical Fiber Researchp. 171
Atomic Force Microscopy Studies on Optical Fibersp. 179
Scanning Tunneling Microscopy Studies of Solvent-Deposited Materials on Highly Oriented Pyrolytic Graphitep. 189
In Situ Study of Stainless Steel's Passive Layer Exposed to HCl Using a Scanning Tunneling Microscopep. 195
Application of Magnetic Force Microscopy in Magnetic Recordingp. 203
Scanning Electron Microscopy, Scanning Tunneling Microscopy, and Atomic Force Microscopy Studies of Selected Videotapesp. 215
Surface Characteristics Evaluation of Thin Films by Atomic Force Microscopyp. 227
Current versus Voltage Characteristics for Deposition and Removal of Gold Nanostructures on a Gold Surface Using Scanning Tunneling Microscopyp. 233
Atomic Force Microscopy of Ion-Beam Modified Carbon Fibersp. 241
Indexp. 249
Table of Contents provided by Blackwell. All Rights Reserved.

ISBN: 9780306455964
ISBN-10: 030645596X
Audience: Professional
Format: Hardcover
Language: English
Number Of Pages: 250
Published: 30th April 1997
Publisher: Springer Science+Business Media
Country of Publication: US
Dimensions (cm): 25.4 x 17.8  x 1.91
Weight (kg): 1.61