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Paperback
Published: 20th September 2002
ISBN: 9784431703365
Number Of Pages: 152
Learn moreAnalytical electron microscopy is one of the most powerful tools today for characterization of the advanced materials that support the nanotechnology of the twenty-first century. In this book the authors clearly explain both the basic principles and the latest developments in the field. In addition to a fundamental description of the inelastic scattering process, an explanation of the constituent hardware is provided. Standard quantitative analytical techniques employing electron energy-loss spectroscopy and energy-dispersive X-ray spectroscopy are also explained, along with elemental mapping techniques. Included are sections on convergent beam electron diffraction and electron holography utilizing the field emission gun. With generous use of illustrations and experimental data, this book is a valuable resource for anyone concerned with materials characterization, electron microscopy, materials science, crystallography, and instrumentation.
| Preface | |
| Basic Principles of Analytical Electron Microscopy | p. 1 |
| Constitution and Basic Operation of Analytical Electron Microscopes | p. 13 |
| Electron Energy-Loss Spectroscopy | p. 43 |
| Energy Dispersive X-ray Spectroscopy | p. 81 |
| Peripheral Instruments and Techniques for Analytical Electron Microscopy | p. 103 |
| Physical Constants, Conversion Factors, Electron Wavelengths | p. 137 |
| Electron Binding Energies and Characteristic X-ray Energies | p. 139 |
| Vacuum System | p. 145 |
| Index | p. 147 |
| Table of Contents provided by Blackwell. All Rights Reserved. |
ISBN: 9784431703365
ISBN-10: 4431703365
Audience:
Professional
Format:
Paperback
Language:
English
Number Of Pages: 152
Published: 20th September 2002
Publisher: Springer Verlag, Japan
Country of Publication: JP
Dimensions (cm): 28.0 x 21.0
x 0.91
Weight (kg): 0.43
