| Impact of the Personal Computer on X-Ray Analysis, Historical Perspective 1960-1990 | p. 1 |
| Software for XRD | p. 7 |
| Software for XRF | p. 13 |
| The Use of PCs for Ab Initio Structure Determination from Powder Diffraction Data | p. 21 |
| Applications of Profile Analysis for Micro-Crystalline Properties from Total Pattern Fitting | p. 27 |
| Applications of Whole-Powder-Pattern Fitting Technique in Materials Characterization | p. 37 |
| Application of ODF to the Rietveld Profile Refinement of Polycrystalline Solid | p. 49 |
| DIFFRAC-AT Search: Search/Match Using Full Traces as Input | p. 59 |
| The Effect of Various Pattern Aberrations on Figures of Merit Used with Whole Pattern Recognition Techniques | p. 67 |
| Lattice Parameters of Bronze-Type [actual symbol not reproducible] (R=Sm and Nd) Solid Solutions for Microwave Dielectric Ceramics | p. 79 |
| An Experimental Evaluation of Computational Methods for Determining Lattice Parameters Using Bragg-Brentano Powder Diffractometry | p. 87 |
| Enhancing XRPD Pattern Quality with Line-Profile-Fitting in Multiphase Systems | p. 95 |
| Powder Diffraction Pattern Simulation and Analysis | p. 101 |
| A New XRD Tool for Metallurgical Research: ICDD's Metals and Alloys Indexes | p. 109 |
| New Developments in PC-Based Powder Data Retrieval Programs | p. 117 |
| New Methods for the Accurate Comparison of Lattice Parameters | p. 123 |
| Experimental Comparison of Widely Differing Lattice Parameters | p. 129 |
| Fourier Transformation of X-Ray Rocking Curves from Interferometer Structures | p. 135 |
| High Speed Characterization of Pseudomorphic HEMT Structures Using a Very Low Noise Scintillation Detector | p. 145 |
| Combined Asymmetric Reflection and Transmission Method for High Accuracy X-Ray Crystallographic Measurements | p. 153 |
| Residual Stress in Thin Films of Aluminum/Hafnium | p. 157 |
| The Effects of Using Long Soller Slits as "Parallel Beam Optics" for GIXRD on Diffraction Data | p. 167 |
| Characterization of TiN Films by XRD and XRF | p. 175 |
| The Use of a Conventional Powder Diffractometer for Thin-Film Thickness Determination from Reflectivity Data | p. 183 |
| Stress-Depth Profiles in Magnetron Sputtered Mo Films Using Crazing Incidence X-Ray Diffraction (GIXD) | p. 189 |
| Development of a Numerical Procedure for Determining the Depth Profiles of X-Ray Diffraction Data | p. 197 |
| Analysis of Multi-Layer Thin Films by XRF | p. 205 |
| Resolving Common Element Problem by Using Different Lines in Fundamental Parameters Method Multilayer Thin Film Analysis | p. 213 |
| Small Area X-Ray Fluorescence Analysis of Multilayer Thin Metal Films | p. 219 |
| High Accuracy Analysis of BPSG Thin Films on Silicon Wafers by X-Ray Wafer Analyzer | p. 229 |
| Complicated Average Stress-Fields and Attempts at Their Evaluation with X-Ray Diffraction Methods | p. 235 |
| Evaluation of [actual symbol not reproducible] from Diffraction Experiments Performed with Synchrotron Radiation in the [Omega]- and [psi]-Goniometries | p. 245 |
| Methods for Depth Profiling Complete Stress Tensors Using Neutron Diffraction | p. 253 |
| Counting Statistical Errors in Principal Stresses and Directions Determined by Diffraction | p. 265 |
| New Advantages in Soft X-Ray Stress Measurement and Triaxial Analysis of Nonuniform Stress States | p. 279 |
| Residual Stress Analysis of Different Microstructures in Alumina Microelectronic Substrates | p. 291 |
| Determination of X-Ray Elastic Constants of Isotropic Materials with Non-Linear SIN[superscript 2][psi] Diagrams | p. 299 |
| Measurement of X-Ray Elastic Constants from Ground Ceramic Showing Non-Linear Sin[superscript 2][psi] Diagrams | p. 305 |
| X-Ray Stress Measurement of Alloy Steels | p. 317 |
| X-Ray Fractographic Study on Fatigue Fracture Surface of Ductile Cast Iron | p. 327 |
| Application of X-Ray Examination to Fracture Surface of TiAl Intermetallic Compound | p. 335 |
| Size/Strain Broadening Analysis of SRM 676 Candidate Materials | p. 343 |
| X-Ray Profile Analysis of 12% Chromium Stainless Steel | p. 351 |
| Microcrystalline Properties of Quartz by Means of XRPD Measures | p. 359 |
| X-Ray Diffraction Orientation Studies Using Two-Dimensional Detectors | p. 367 |
| Julios: A Position-Sensitive Neutron Detector and Its Application to White Beam Time-of-Flight Diffraction | p. 375 |
| The Development of a Time-Resolved X-Ray Measurement System Using Imaging Plate | p. 385 |
| Thickness Gauging of Organic Films on Large Plastic Body Parts with an XRF Probe Based on a Room-Temperature Mercuric Iodide Detector | p. 395 |
| High Energy Resolution X-Ray Spectrometer for High Count Rate XRF Applications | p. 405 |
| Ultra-High Vacuum Grazing Incidence Small Angle X-Ray Scattering Camera for In Situ Surface Analysis | p. 413 |
| High-Pressure Powder Diffraction Using an Image-Plate Area Detector | p. 419 |
| Application of a Flatbed Transparency Scanner as an XRD Scanning Densitometer | p. 433 |
| Measurements of the Thermal Expansion of Materials with High Melting Points by X-Ray Diffraction | p. 441 |
| The Effective Thermal Expansion of Nickel and Nickel Oxide During High-Temperature Oxidation | p. 449 |
| Low Temperature Attachment for X-Ray Powder Diffractometry | p. 457 |
| The Construction of Quantitative Inverse Pole Figures Using the Available ODF Data | p. 465 |
| Texture Measurement of Sintered Alumina Using the March-Dollase Function | p. 473 |
| In Situ X-Ray Diffraction of an Arc Weld Showing the Phase Transformations of Ti and Fe as a Function of Position in the Weld Performed at a Synchrotron | p. 479 |
| Measurement of Retained Austenite in Stainless Steel Using Imaging Plate | p. 483 |
| Analysis of the Average Poly-Cyclic Aromatic Unit in a Meta-Anthracite Coal Using Conventional X-Ray Powder Diffraction and Intensity Separation Methods | p. 491 |
| Capillary Optics for X-Ray Analysis | p. 499 |
| A New X-Ray Lens and Its Applications | p. 507 |
| Transcendental Cylindrical Reflectors in Glancing X-Ray Optics | p. 515 |
| Toroidally Shaped HOPG Crystals as Strongly Focusing Bragg Reflectors of Characteristic X-Ray Tube Radiation for EDXRF Analysis | p. 523 |
| The Use of Multilayer Structures in the Energy Dispersive X-Ray Fluorescence Analysis of Low Z Elements | p. 535 |
| Characteristics of New Pyrolitic Graphite Crystal for X-Ray Diffraction and Fluorescence Analysis | p. 545 |
| Optics for X-Ray Microfluorescence to be Used at the European Synchrotron Radiation Facility | p. 553 |
| TXRF Semiconductor Applications | p. 565 |
| Total Reflection XRF of Light Elements Using Various Excitation Sources | p. 577 |
| Total Reflection X-Ray Fluorescence Spectroscopy: Analysis of GaAs and InGaAs | p. 585 |
| Optimization of TRXF Spectrometer with Bent Cut-Off Filter | p. 595 |
| TXRF High Sensitivity X-Ray Analyzer with Multi-Layer Monochromator | p. 599 |
| Fluorescence Yield XANES and EXAFS Experiments: Application to Highly Dilute and Surface Samples | p. 607 |
| XRF with Tunable Monochromatic Excitation and Variation of the Incidence Angle | p. 619 |
| Sensitivity Improvement and Stabilization for Ultra Light Element Analysis by X-Ray Spectrometry | p. 629 |
| Why the Fundamental Algorithm is so Fundamental | p. 639 |
| Mathematical Modeling of XRF Matrix Correction Algorithms with an Electronic Spreadsheet | p. 647 |
| New Empirical Regression Type Algorithm and Software for High Precision XRF Spectrometry | p. 657 |
| Matrix Correction with Barkla Excitation Using the Coherent/Incoherent Method | p. 667 |
| Analysis of Boron and Other Light Elements in Glasses by the Fundamental Parameter Method | p. 677 |
| Investigation of Geometrical Effects in X-Ray Microfluorescence Analysis of Geological Samples | p. 685 |
| Evaluating Indirectly the X-Ray Tube Spectra on the Basis of the Fundamental Parameter Method in Wavelength-Dispersive X-Ray Spectrometry | p. 689 |
| Measurement of Relative X-Ray Intensity Ratios for Elements with Z-14 to 92 Using EDXRF Spectrometer | p. 697 |
| Study of Combustion Originated Ash Particles | p. 711 |
| High Productivity Geochemical XRF Analysis | p. 717 |
| Computerized X-Ray Data Periodic Table | p. 725 |
| On-Line Analysis of Molten Metals Using a Wavelength Dispersive X-Ray Spectrometer | p. 729 |
| Quantitative XRF Analysis of Coal after Successive Leachings | p. 735 |
| A New Method of Graphic Representation of Sample Analysed by XRF | p. 741 |
| Author Index | p. 747 |
| Subject Index | p. 749 |
| Table of Contents provided by Blackwell. All Rights Reserved. |
