Advances in X-Ray Analysis : Advances in X-Ray Analysis - John V. Gilfrich

Advances in X-Ray Analysis

By: John V. Gilfrich (Editor), Ting C. Huang (Editor), C.R. Hubbard (Editor)

Hardcover

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Proceedings of the 41st Annual Conference on Applications of X-ray Analysis, held at Colorado Springs, Colorado in August 1992. The volume is divided into ten sections: mathematical techniques in x-ray spectrometry; analysis of light elements by x-ray spectrometry; XRS techniques and instrumentation

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