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Advances in X-Ray Analysis : Volume 35B - C.S. Barrett

Advances in X-Ray Analysis

Volume 35B

By: C.S. Barrett (Editor), John V. Gilfrich (Editor), Ting C. Huang (Editor)

Hardcover | 31 October 1992

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Whole Pattern Fitting, Rietveld Analysis, and Calculated Diffraction Patterns. Quantitative Phase Analysis by XRay Diffraction (XRD). Thin Film and Surface Characterization by XRD. Lattice Defects and XRay Topography. Texture Analysis by XRD. XRD Instrumentation, Techniques, and Reference Materials. Stress Determination by Diffraction Methods. XRD Profile Fitting, Crystallite Size and Strain Determination. XRD Applications: Detection Limits, Superconductors, Organics, Minerals. Mathematical Methods in XRay Spectrometry (XRS). Thin Film and Surface Characterization by XRS and XPS. Total Reflection XRS. XRS Techniques and Instrumentation. XRS Applications. XRay Imaging and Tomography. 161 articles. Index.

Other Editions and Formats

Paperback

Published: 21st October 2011

Paperback

Published: 4th October 2011

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