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Thermal Testing of Integrated Circuits

Paperback

Available: 31st July 2013
RRP $204.99
$184.95
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Temperature has been always considered as an appreciable magnitude to detect failures in electric systems. In this book, the authors present the feasibility of considering temperature as an observable for testing purposes, with full coverage of the state of the art.

1. Introduction to the Testing of Integrated Circuits. 2. Thermal Transfer and Thermal Coupling in IC's. 3. Thermal Analysis in Integrated Circuits. 4. Temperature as a Test Observable Variable in IC's. 5. Thermal Monitoring of IC's. 6. Feasibility Analysis and Conclusions. Index.

ISBN: 9781441952875
ISBN-10: 144195287X
Audience: Professional
Format: Paperback
Language: English
Number Of Pages: 218
Available: 31st July 2013
Dimensions (cm): 24.0 x 16.0