Materials research plays a central role in the development of microsystems in a number of different ways. More specifically, materials aspects are important issues for both the choice of fabrication method and the design of microcomponents and systems to obtain the desired functions. This book focuses on materials as they are used in microsystems for mechanics (i.e., mechanical sensors such as accelerometers and pressure sensors, and actuators such as micropumps and micromotors) and optics (i.e., optical microcomponents, couplers and switches). Often the materials used are thin films, with thicknesses ranging from fractions of a micrometer to tens of micrometers, and the properties of which usually strongly depend on the details of the deposition process. Researchers discuss this complex interplay between materials, design and fabrication processes. Topics range from exciting MEMS technologies and exotic materials such as diamond-like carbon and aluminum nitride, to various characterization and testing methods and fabrication techniques.
| Preface | |
| Materials Research Society Symposium Proceedings | |
| Technology for Microassembling | p. 3 |
| Hard Quasiamorphous Carbon - A Prospective Construction Material for Micro-Electro-Mechanical Systems | p. 15 |
| Polymers for Optical-Communications Device Fabrication Optical Adhesives and Polyimide Waveguides | p. 27 |
| Mechanical and Thermophysical Properties of Thin Film Materials for MEMS: Techniques and Devices | p. 39 |
| Piezoelectric Force Sensing Pb(Zr,Ti)O[subscript 3] Microcantilever Array for Multiprobe Scanning Force Microscopy | p. 59 |
| Selective Electroless Copper Metallization of Epoxy Substrates | p. 69 |
| Design and Properties of a Thin-Film, MEMS-Based Magnetostrictive Magnetometer | p. 75 |
| XRD and XTEM Investigation of Polycrystalline Silicon Carbide on Polycrystalline Silicon | p. 81 |
| Improved Autoadhesion Measurement Method for Micromachined Polysilicon Beams | p. 87 |
| Elastic Properties of Diamondlike Carbon Thin Films: A Brillouin Scattering Study | p. 93 |
| Hardening of Nickel Alloys by Ion Implantation of Titanium and Carbon | p. 99 |
| Patterned Sol-Gel Structures by Micro Molding in Capillaries | p. 105 |
| Measurements of Residual Stresses in Low-Stress Silicon Nitride Thin Films Using Micro-Rotating Structures | p. 111 |
| Thermal Conductivity of CVD-Diamond Films Between 80 and 700 K | p. 117 |
| A Study of Hermetic Glass Sealing Using a Modified Direct Bonding Method | p. 123 |
| Influence of the Structural Parameters of Polysilicon Films on the Piezoresistive Properties at High Temperature | p. 131 |
| Effect of Thermoelastic Stress on the Pressure Response of a Composite SiO[subscript 2]/Si Membrane | p. 137 |
| Fabrication Processes and Characteristics of Microelectromechanical System Using PZT Films | p. 143 |
| Optical Waveguiding (Pb,La)(Zr,Ti)O[subscript 3] Thin Films Prepared by Pulsed Laser Deposition | p. 149 |
| Pulsed laser Deposition and Acoustic Property of Piezoelectric/Nonpiezoelectric Multilayer Films | p. 155 |
| Charge Trapping and Degradation Properties of PZT Thin Films for MEMS | p. 161 |
| A Low Temperature Direct Bonding Method Using an Electron-Beam Evaporated Silicon-Oxide Interlayer | p. 167 |
| Experimental Analysis of the Process of Anodic Bonding Using an Evaporated Glass Layer | p. 173 |
| Micro-Raman Study of Stress Distribution and Thermal Relaxation of Oxidized Silicon Membranes | p. 179 |
| A New Technique for Measuring Poisson's Ratio of MEMS Materials | p. 185 |
| Photoconductivity in Vacuum Deposited Films of Silicon-Based Polymers | p. 191 |
| Structural Characterization of p++ Si:B Layers for Bulk Micromachining | p. 197 |
| Silicon Microhotplate Arrays as a Platform for Efficient Gas Sensing Thin Film Research | p. 203 |
| Mechanical Behavior of a MEMS Acoustic Emission Sensor | p. 209 |
| Characterization of the Piezoelectric Response of Aluminum Nitride Grown by DC Magnetron Sputtering for Applications in Thin-Film Resonators | p. 215 |
| The Effect of Inorganic Thin Film Material Processing and Properties on Stress in Silicon Piezoresistive Pressure Sensors | p. 221 |
| Titanium-Nickel Shape Memory Thin Film Actuators for Micromachined Valves | p. 227 |
| Development of Micromirror Using Piezoelectric Excited and Actuated Structures | p. 233 |
| Author Index | p. 239 |
| Subject Index | p. 241 |
| Table of Contents provided by Blackwell. All Rights Reserved. |
ISBN: 9781558993488
ISBN-10: 1558993487
Series: MRS Proceedings
Audience:
Professional
Format:
Hardcover
Language:
English
Number Of Pages: 242
Published: 30th March 1997
Publisher: Materials Research Society
Dimensions (cm): 23.0 x 15.6
x 1.8
Weight (kg): 0.499