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X-Ray Line Profile Analysis in Materials Science - Jen Gubicza

X-Ray Line Profile Analysis in Materials Science

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X-ray line profile analysis is an effective and non-destructive method for the characterization of the microstructure in crystalline materials. Supporting research in the area of x-ray line profile analysis is necessary in promoting further developments in this field.

X-Ray Line Profile Analysis in Materials Science aims to synthesize the existing knowledge of the theory, methodology, and applications of x-ray line profile analysis in real-world settings. This publication presents both the theoretical background and practical implementation of x-ray line profile analysis and serves as a reference source for engineers in various disciplines as well as scholars and upper-level students.

ISBN: 9781466658530
ISBN-10: 1466658533
Format: PDF
Language: English
Number Of Pages: 359
Published: 31st March 2014
Edition Number: 1