By: P. G. Allen (Editor), S. M. Mini (Editor), D. L. Perry (Editor), S. R. Stock (Editor)

Hardcover

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Much like earlier books in the series, this collection of papers brings together the materials science community and the characterization techniques that use synchrotron radiation. Surfaces, interfaces, electronic materials, thin films, carbides, polymers and alloys are all addressed. And while the editors did not anticipate that the cluster of papers treating cementitious materials would necessitate a separate section, it is interesting to see the application of cutting-edge techniques to Portland cement, a very complex materials system long used in engineering structures. Topics include: X-ray diffraction - structures and transformations; X-ray diffraction - stress, strain and texture; microtomography and microdiffraction; SR methods applied to cementitious materials; magnetic materials; X-ray absorption and photoemission; and X-ray scattering and interfaces.

Preface	p. ix
Acknowledgments	p. xi
Materials Research Society Symposium Proceedings	p. xii
X-Ray Diffraction--Structures and Transformations
Structure of Crystallographically Challenged Materials by Profile Analysis of Atomic Pair Distribution Functions: Study of LiMoS[subscript 2] and Mesostructured MnGe[subscript 4]S[subscript 10]	p. EE1.5
X-Ray Diffraction--Stress, Strain, and Texture
Stress Distribution and Tomographic Profiling With Energy Dispersive X-ray Scattering	p. EE2.1
Synchrotron X-ray Diffraction Measurement of Reinforcement Strains in Uniaxially Stressed Bulk Metallic Glass Composites	p. EE2.3
Residual Stresses in Silicon Nitride Based Composites Using Synchrotron Radiation	p. EE2.4
Analysis of Residual Stress Gradients Below the Surface of a Material Using a Multi-Energy Method	p. EE6.6
High Resolution X-ray Characterization of Tl-2212 Superconducting Thin Films	p. EE2.5
Synchrotron X-ray Study of Texture in Cold-Worked Shape-Memory NiTi-Wires	p. EE2.6
A Synchrotron X-ray Study of Texture Induced by Application of Magnetic Fields During Phase-Transformations in Shape-Memory Ni-Mn-Ga	p. EE2.7
Study of TaSi[subscript 2]-Si Crystals With High Energy Synchrotron Radiation as Tunable Wide-Bandpass Monochromator and Analyzer Optics	p. EE6.2
Microtomography and Microdiffraction
Comparison of Crack Geometry Determined With Phase Contrast Radiography and With Microtomography	p. EE3.6
Energy-Tunable X-ray Diffraction in Polycrystalline Materials: A Look at Microstructure in Seashells	p. EE3.7
Microcracks in Carbon/Carbon Composites: A Microtomography Investigation Using Synchrotron Radiation	p. EE3.8
Sr Methods Applied to Cementitious Materials
The Use of a Variety of Synchrotron Techniques in the Study of Cementitious Materials	p. EE5.4
Mapping the Distribution of Corrosion Products in Cement Exposed to Sulfate Using Energy Dispersive X-ray Diffraction	p. EE5.3
Grazing Incidence Small-Angle X-ray Scattering Applied to the Characterization of Nanocomposite Thin Films	p. EE5.6
Magnetic Materials
Correlated Local Atomic Displacements: The Microscopic Origins for Macroscopic Phenomena	p. EE7.1
Structural Distortions in the Paramagnetic Insulating Phase of La[subscript 0.7]Ca[subscript 0.3]MnO[subscript 3]	p. EE7.3
X-ray Magneto-Optics in Lanthanide Materials	p. EE7.7
X-Ray Absorption and Photoemission
In Situ X-ray Absorption Spectroscopy in the Soft Energy Range: Novel Prospects for the Chemical Characterization of Solid State Surfaces at High Pressure and High Temperature	p. EE8.3
Structure and Bonding of Metallic Nanowires Prepared in Nanoporous Alumina Membranes Studied by EXAFS, XANES and HED	p. EE6.1
XANES and EXAFS Analysis of Ball-Milled Fe-Ni	p. EE8.4
Photoemission and Photoabsorption Study of YNi[subscript 2-x]Co[subscript x]B[subscript 2]C Superconductors	p. EE8.5
X-Ray Scattering and Interfaces
X-ray Scattering Measurements of the Ag(111) Surface Thermal Expansion	p. EE9.3
Investigations of Buried Interfaces Using High Energy X-ray Reflectivity	p. EE9.9
Grazing Incidence X-ray Diffraction Studies of Thin Films at the Air-Liquid Interface	p. EE9.10
X-ray Reflectivity and GISAXS Study of Derelaxation in Kr Implanted Si	p. EE6.4
Author Index
Subject Index
Table of Contents provided by Syndetics. All Rights Reserved.

ISBN: 9781558996144
ISBN-10: 1558996141
Series: MRS Proceedings
Audience: Professional
Format: Hardcover
Language: English
Number Of Pages: 198
Published: 13th November 2001
Publisher: Materials Research Society
Weight (kg): 1.0